文档简介(最多显示3000字)：
DRAM测试介绍
Introduction to DRAM Testing
Agenda
Basis of Testing
Typical DRAM Testing Flow
Burn-in
DC Test (Open/Short, Leakage, IDD)
Functional Test & Test Pattern
Speed Test
Why Testing?
To screen out defect
Wafer defect
Assembly defect
Make sure product meet spec of customer
Voltage guard band
Temperature guard band
Timing guard band
Complex test pattern
Collect data for design & process improvement
Quality
Reliability
Cost
Efficiency
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